Faculty Members

LANGUAGE ≫ Japanese
liao-wang-1.jpg

Assistant Professor
LIAO Wang

Doctor (Informatics), Osaka University, Japan, 2019

Areas of specialization VLSI
FPGA
Quantuam Error Correction
Laboratory/research office Quantum and Classical Integrated Circuit Laboratory
Integrated circuits (ICs) consist of numerous basic cells for computation; they are the core components of computers, which serve as the brains of the Information Society. To support response to the explosively increasing demands for computation tasks in applications such as artificial intelligence (AI), our laboratory is mainly working toward the development of methods for the design of high-efficiency, high-reliability classical ICs. Furthermore, in anticipation of the promising　quantum computing in the era of post-CMOS, we are researching methods for meeting challenges related to the integration of quantum bits, including quantum error correction, so as to realize practical large-scale quantum computers.
Current research topics soft error Accelerator based on FPGA for Deep Learning Fault Tolerant Quantum Computing
Educational background 2019: Doctor, Osaka University, Japan
2015: Master, Northeastern University (P.R.C), China
2013: Bachelor, Shenyang University of Technology, China
Professional background 2023-: Visiting Researcher, the University of Tokyo
2023-: Assistant Professor, Kochi University of Technology
2022-2023: Visiting Researcher, NTT Computer and Data Science Laboratories
2021-2023: Project-specific Researcher, University of Tokyo
2019-2021: Research Associate, Kochi University of Technology
2019-2021: Visiting Researcher, Osaka University
Licenses
Academic societies IEEE
IPSJ

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Courses

* Courses provided in English are shown with (E) mark

Undergraduate school
  • CAD/Descriptive Geometry
  • Introduction to Computer Engineering
  • Experiments of Electronic and Photonic 2
  • Graduation Thesis
  • Electronic System Design
Graduate school

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Research activities

Research papers
  1. Authors: Cheng Quan, Chi Hao-Yang, Liang Chien-Hsing, Chao Yu-Hong, Zhang Huizi, Liang Yuan, Zhang Mingtao, LIAO Wang, Xiong Jinjun, Liou Jing-Jia, Hashimoto Masanori, Lin Longyang
    Title: Genshin: A Generalized Framework with Software-Hardware Co-design and Pruned Fault Injection for Reliability Analysis
    Journal: ITC, IEEE
    Year: 2025
  2. Authors: Gomi Yuibi, Takami Kazusa, Mizuno Rurie, Niikura Megumi, Yasuda Ryuichi, Deng Yifan, Kawase Shoichiro, Watanabe Yukinobu, Abe Shin-Ichiro, LIAO Wang, Tampo Motonobu, Takeshita Soshi, Shimomura Koichiro, Miyake Yasuhiro, Hashimoto Masanori
    Title: Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files
    Journal: IEEE Transactions on Nuclear Science, Vol. 72, No. 8, pp. 2751-2762, IEEE
    Year: 2025
  3. Authors: Cheng Quan, Li Qiufeng, Yang Zhengke, Kong Zhen, Niu Gaoqiang, Liang Yuan, Li Jiamin, Park Jeong Hoan, LIAO Wang, Awano Hiromitsu, Sato Takashi, Lin Longyang, Hashimoto Masanori
    Title: A Radiation-Hardened Neuromorphic Imager with Self-Healing Spiking Pixels and Unified Spiking Neural Network for Space Robotics
    Journal: VLSI Symposium, No. C27-3, pp. 1-3, IEEE
    Year: 2025
  4. Authors: Cheng Quan, LIAO Wang, Zhang Ruilin, Yu Hao, Lin Longyang, Hashimoto Masanori
    Title: HachiFI: A Lightweight SoC Architecture-Independent Fault-Injection Framework for SEU Impact Evaluation
    Journal: DATE, pp. 1-7, IEEE
    Year: 2025
  5. Authors: Cheng Quan, Li Qiufeng, Lin Longyang, LIAO Wang, Dai Liuyao, Yu Hao, Hashimoto Masanori
    Title: How accurately can soft error impact be estimated in black-box/white-box cases?--a case study with an edge AI SoC--
    Journal: DAC, IEEE
    Year: 2024
  6. Authors: Deng Yifang, Watanabe Yukinobu, Manabe Seiya, LIAO Wang, Hashimoto Masanori, Abe Shin-ichiro, Tampo Motonobu, Miyake Yasuhiro
    Title: Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs
    Journal: IEEE Transactions on Nuclear Science, Vol. 71, No. 4, pp. 912-920, Institute of Electrical and Electronics Engineers (IEEE)
    Year: 2024
  7. Authors: Yasunari Suzuki, Yosuke Ueno, LIAO Wang, Masamitsu Tanaka, Teruo Tanimoto
    Title: Circuit designs for practical-scale fault-tolerant quantum computing
    Journal: IEEE Symposium on VLSI Technology and Circuits, IEEE
    Year: 2023
  8. Authors: Shin-Ichiro Abe, Masanori Hashimoto, LIAO Wang, Takashi Kato, Hiroaki Asai, Kenichi Shimbo, Hideya Matsuyama, Tatsuhiko Sato, Kazutoshi Kobayashi, Yukinobu Watanabe
    Title: A Terrestrial SER Estimation Methodology based on Simulation coupled with One-Time Neutron Irradiation Testing
    Journal: IEEE Transactions on Nuclear Science, Vol. 70, No. 8, pp. 1652-1657, IEEE
    Year: 2023
  9. Authors: LIAO Wang, Suzuki Yasunari, Tanimoto Teruo, Ueno Yosuke, Tokunaga Yuuki
    Title: WIT-Greedy: Hardware System Design of Weighted ITerative Greedy Decoder for Surface Code
    Journal: ASP-DAC
    Year: 2023
  10. Authors: Suzuki Yasunari, Sugiyama Takanori, Arai Tomochika, LIAO Wang, Inoue Koji, Tanimoto Teruo
    Title: Q3DE: A Fault-Tolerant Quantum Computer Architecture for Multi-bit Burst Errors by Cosmic Rays
    Journal: IEEE MICRO
    Year: 2022
  11. Authors: Tanaka Tomonari, LIAO Wang, Hashimoto Masanori, Yukio Mitsuyama
    Title: Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior
    Journal: IEEE Transactions on Nuclear Science , Vol. 69, No. 1
    Year: 2022
  12. Authors: LIAO Wang, Ito Kojiro, Abe Shin-ichiro, Mitsuyama Yukio, Hashimoto Masanori
    Title: Characterizing Energetic Dependence of Low-Energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM
    Journal: IEEE Transactions on Nuclear Science, Vol. 68, No. 6
    Year: 2021
  13. Authors: LIAO Wang, Hashimoto Masanori, Manabe Seiya, Watanabe Yukinobu, Abe Shin-ichiro, Tampo Motonobu, Takeshita Soshi, Miyake Yasuhiro
    Title: Impact of the Angle of Incidence on Negative Muon-induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs
    Journal: IEEE Transactions on Nuclear Science, Vol. 67, No. 7
    Year: 2020
  14. Authors: LIAO Wang, Hashimoto Masanori, Manabe Seiya, Abe Shin-ichiro, Watanabe Yukinobu
    Title: Similarity Analysis on Neutron and Negative Muon-induced MCUs in 65-nm Bulk SRAM
    Journal: IEEE Transactions on Nuclear Science, Vol. 66, No. 8
    Year: 2019
  15. Authors: LIAO Wang, Hashimoto Masanori
    Title: Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-level Neutron-induced Soft Error Rate
    Journal: IEICE Transactions on Electronics, Vol. E102C, No. 4
    Year: 2019
  16. Authors: LIAO Wang, Hashimoto Masanori, Manabe Seiya, Watanabe Yukinobu, Abe Shin-ichiro, et al.
    Title: Measurement and Mechanism Investigation of Negative and Positive Muon-induced Upsets in 65-nm Bulk SRAMs
    Journal: IEEE Transactions on Nuclear Science, Vol. 65, No. 8
    Year: 2018
Keynote lectures
  1. When advanced memories meet soft errors --- challenges from the new source and for the new devices ---, 6th International Conference on Radiation Effects of Electronic Devices, Yangzhou, 2025
Invited lectures
  1. Test flow for soft error-induced malfunction in FPGA-based autonomous driving system using virtual environment, 2022
  2. Reliability Evaluation of Soft Error in SRAM FPGA-based Lane Edge Tracking in Autonomous Driving System, Soft Error Symposium, online, 2021
  3. Characterization of 65-nm Bulk SRAM Using Muon, Spallation and Quasi-monoenergetic Neutron Sources, Soft Error Symposium, Fukuoka, 2018
Awards
  1. IEEE CAS Kansai Chapter Student Research Award, 2020
  2. RADECS 2018 Best Paper Reward, 2018
Grants-in-Aid for Scientific Research from the Japanese government
  1. Project title: Protection Strategies for Configuration Information of SRAM-based FPGA against Soft Errors at Advanced Process Node for Space Applications
    Category: Grant-in-Aid for Early-Career Scientists
    Project number: 21K17721
    Project period: 2021-2023
    Total budget amount: 4,550,000 yen
    Keywords:
  2. Project title: VLSI Design of Scalable Decoder for Fault-tolerant Quantum Computer
    Category: Grant-in-Aid for Early-Career Scientists
    Project number: 24K20755
    Project period: 2024-2028
    Total budget amount: 4,160,000 yen
    Keywords:

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Social activities

Committee roles
  1. Comittee Member, System and LSI Special Interest Group, Information Processing Society of Japan (IPSJ), Information Processing Society of Japan, 2025-2026
  2. Co-chair, The 51th Quantum Information Technology Symposium (QIT51)
  3. Shikoku Section Nominating Committee, IEEE , 2024-2026

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