教員情報詳細

廖 望LIAO Wang
- 1992年生まれ 男性
- 職位: 助教
- 所属: 学群 システム工学群
教員略歴
学位 |
博士学位(情報科学)
修士学位(工学) 学士学位(工学) |
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学歴 |
大阪大学情報科学研究科情報システム工学 修了(2019)
東北大学(中国)情報科学研究科制御工学 修了(2015) 瀋陽工業大学(中国)電気工学部制御工学 卒業(2013) |
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職歴 |
高知工科大学システム工学群 助教(2019~)
大阪大学大学院情報科学研究科 招へい研究員(2019~2021) |
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資格 | ||
専門分野 | VLSI | |
研究室 | 名称 | |
詳細 | ||
所属学会 | IEEE |
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本年度担当講義
学部・学群 | |
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大学院 |
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研究シーズ
現在の研究 | Soft error |
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メッセージ
研究業績
主な受賞歴など
- RADECS 2017 Best Paper(2018)
代表的な研究論文
タイトル | 著者 | 発表誌 | 発表年 |
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Impact of the Angle of Incidence on Negative Muon-induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs | Wang LIAO,Masanori Hashimoto,Seiya Manabe,Yukinobu Watanabe,Shin-ichiro Abe,Motonobu Tampo,Soshi Takeshita,Yasuhiro Miyake | IEEE Trans. on Nucl. Sci. | 2020 |
Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF | Junya Kuroda,Seiya Manabe,Yukinobu Watanabe,Kojiro Ito,Wang LIAO,Masanori Hashimoto,Shin-ichiro Abe,Masahide Harada,Kenichi Oikawa,Yasuhiro Miyake | IEEE Trans. on Nucl. Sci. | 2020 |
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility | Takumi Mahara,Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Takeshi Y. Saito,Megumi Niikura,Kazuhiko Ninomiya,Dai Tomono,Akira Sato | IEEE Trans. on Nucl. Sci. | 2020 |
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM | Wang LIAO,Masanori Hashimoto,Seiya Manabe,Shin-ichiro Abe,Yukinobu Watanabe | IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1390-1397 | 2019 |
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs | Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Shin-ichiro Abe | IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1398-1403 | 2019 |
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs | Shin-ichiro Abe,Wang LIAO,Seiya Manabe,Tatsuhiko Sato,Masanori Hashimoto,Yukinobu Watanabe | IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1374-1380 | 2019 |
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate | Wang LIAO,Masanori Hashimoto | IEICE Trans. Electron.,Vol.E102-C ,No.4,pp.296-302 | 2019 |
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs | Wang LIAO,Masanori Hashimoto,Seiya Manabe,Yukinobu Watanabe,Shin-ichiro Abe,Keita Nakano,Hikaru Sato,Tadahiro Kin,Koji Hamada,Motonobu Tampo,Yasuhiro Miyake | IEEE Trans. on Nucl. Sci.,Vol.65,No.8,pp.1734-1741 | 2018 |
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs | Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Keita Nakano,Hikaru Sato,Tadahiro Kin,Shin-ichiro Abe,Koji Hamada,Motonobu Tampo,Yasuhiro Miyake | IEEE Trans. on Nucl. Sci.,Vol.65,No.8,pp.1742-1749 | 2018 |
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学会発表・講演など
- Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs,International Reliability Physics Symposium (IRPS)(2020)
- Impact of Incident Angle on Negative Muon-induced SEU Cross Section of 65-nm Bulk and FDSOI SRAM,European Conference on RADiation Effects on Components and Systems (RADECS)(2019)
- Negative and Positive Muon-induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs,International Reliability Physics Symposium (IRPS)(2019)
- Similarity analysis on neutron- and negative moun-induced MCUs in 65-nm bulk SRAM,European Conference on RADiation Effects on Components and Systems (RADECS)(2018)
- Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65nm Bulk SRAMs,European Conference on RADiation Effects on Components and Systems (RADECS)(2017)
- Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --,International NEWCAS Conference(2017)