教員情報詳細

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廖 望LIAO Wang

  • 1992年生まれ 男性
  • 職位: 助教
  • 所属: システム工学群

教員略歴

学位 博士学位(情報科学)
修士学位(工学)
学士学位(工学)
学歴 大阪大学情報科学研究科情報システム工学 修了(2019)
東北大学(中国)情報科学研究科制御工学 修了(2015)
瀋陽工業大学(中国)電気工学部制御工学 卒業(2013)
職歴 高知工科大学システム工学群 助教(2019~)
大阪大学大学院情報科学研究科 招へい研究員(2019~2021)
資格
専門分野 VLSI
研究室 名称
詳細
所属学会 IEEE

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本年度担当講義

学部・学群
大学院

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研究シーズ

現在の研究 Soft error

メッセージ

研究業績

主な受賞歴など

  • RADECS 2017 Best Paper(2018)

代表的な研究論文

タイトル 著者 発表誌 発表年
Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM Wang LIAO,Kojiro Ito,Yukio Mitsuyama,Masanori Hashimoto IEEE Trans. on Nucl. Sci. 2021
Impact of the Angle of Incidence on Negative Muon-induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs Wang LIAO,Masanori Hashimoto,Seiya Manabe,Yukinobu Watanabe,Shin-ichiro Abe,Motonobu Tampo,Soshi Takeshita,Yasuhiro Miyake IEEE Trans. on Nucl. Sci. 2020
Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLF Junya Kuroda,Seiya Manabe,Yukinobu Watanabe,Kojiro Ito,Wang LIAO,Masanori Hashimoto,Shin-ichiro Abe,Masahide Harada,Kenichi Oikawa,Yasuhiro Miyake IEEE Trans. on Nucl. Sci. 2020
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility Takumi Mahara,Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Takeshi Y. Saito,Megumi Niikura,Kazuhiko Ninomiya,Dai Tomono,Akira Sato IEEE Trans. on Nucl. Sci. 2020
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM Wang LIAO,Masanori Hashimoto,Seiya Manabe,Shin-ichiro Abe,Yukinobu Watanabe IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1390-1397 2019
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Shin-ichiro Abe IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1398-1403 2019
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs Shin-ichiro Abe,Wang LIAO,Seiya Manabe,Tatsuhiko Sato,Masanori Hashimoto,Yukinobu Watanabe IEEE Trans. on Nucl. Sci.,Vol.66,No.7,pp.1374-1380 2019
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate Wang LIAO,Masanori Hashimoto IEICE Trans. Electron.,Vol.E102-C ,No.4,pp.296-302 2019
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs Wang LIAO,Masanori Hashimoto,Seiya Manabe,Yukinobu Watanabe,Shin-ichiro Abe,Keita Nakano,Hikaru Sato,Tadahiro Kin,Koji Hamada,Motonobu Tampo,Yasuhiro Miyake IEEE Trans. on Nucl. Sci.,Vol.65,No.8,pp.1734-1741 2018
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs Seiya Manabe,Yukinobu Watanabe,Wang LIAO,Masanori Hashimoto,Keita Nakano,Hikaru Sato,Tadahiro Kin,Shin-ichiro Abe,Koji Hamada,Motonobu Tampo,Yasuhiro Miyake IEEE Trans. on Nucl. Sci.,Vol.65,No.8,pp.1742-1749 2018

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学会発表・講演など

  1. Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs,International Reliability Physics Symposium (IRPS)(2020)
  2. Impact of Incident Angle on Negative Muon-induced SEU Cross Section of 65-nm Bulk and FDSOI SRAM,European Conference on RADiation Effects on Components and Systems (RADECS)(2019)
  3. Negative and Positive Muon-induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs,International Reliability Physics Symposium (IRPS)(2019)
  4. Similarity analysis on neutron- and negative moun-induced MCUs in 65-nm bulk SRAM,European Conference on RADiation Effects on Components and Systems (RADECS)(2018)
  5. Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65nm Bulk SRAMs,European Conference on RADiation Effects on Components and Systems (RADECS)(2017)
  6. Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --,International NEWCAS Conference(2017)

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