Faculty Members

WATAMORI Michio

Year of birth: 1962
Gender: Male
Affiliation:

- School of Systems Engineering
- Electronic and Photonic Systems Engineering Course, Department of Engineering, Graduate School of Enginering

Areas of specialization
Laboratory/research office	Design and Creation of Prototyping Boards of Electrical Circuits to control various Sensors using Micro-processor Chips The aim of the Laboratory research is to replace high precision electric circuits in quite accurate measurement equipment by simple and cheap electric boards with help of newly developed microprocessor technologies and digital signal processing technologies. The design and creation of Prototyping boards by ourselves lead us to improve the ability of construction of circuits. 3D printers should also be used.
Current research topics
Educational background
Professional background
Licenses
Academic societies

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Courses

* Courses provided in English are shown with (E) mark

Undergraduate school	Graduation Thesis Digital Signal Processing Transient Analysis of Electrical Circuits
Graduate school	Seminar 1 Seminar 2 Individual Work for Graduate

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Research papers	Authors: M.Watamori, M.Isono, H.Madono, Y.Kawano, K.Sasabe, T.Hirao, K.Oura Title: Ion beam analysis of PZT thin films Journal: Appl. Surf. Sci., No. 142, pp. 422-427 Year: 1999 Authors: M.Watamori, O.Kubo, K.Oura Title: A new method for the detection of native oxide on Si with combined use of 16O (α, α) 16O resonance and channeling Journal: Appl. Surf. Sci., No. 113/114, pp. 403-407 Year: 1997 Authors: M.Watamori, S.Honda, O.Kubo, I.Kanno, T.Hirao, K.Sasabe, K.Oura Title: High-energy ion beam analysis of ferroelectric thin films Journal: Appl. Surf. Sci., No. 117/118, pp. 453-458 Year: 1997 Authors: M.Watamori, K.Oura, T.Hirao, K.Sasabe Title: Backscattering analysis of thin SiO2 films on Si using 16O (α, α) 16O 3.045MeV resonance Journal: Nucl. Instr. & Methods, No. B118, pp. 228-232 Year: 1996 Authors: M.Watamori, T.Hirao, K.Sasabe Title: Channeling analysis of oxygen in oxide materials using 16O (α, α) 16O resonant backscattering Journal: Nucl. Instr. & Methods, No. B118, pp. 233-237 Year: 1996 Authors: M.Watamori Title: Methodology for Accurate Oxygen Distribution Analysis and Its Application to YBa_2Cu_3O_x Thin Films Using ＾＜16＞O (a, a) ＾＜16＞O 3.045 MeV Resonance Reaction Journal: Year: 1900

Research papers

Authors: M.Watamori, M.Isono, H.Madono, Y.Kawano, K.Sasabe, T.Hirao, K.Oura
Title: Ion beam analysis of PZT thin films
Journal: Appl. Surf. Sci., No. 142, pp. 422-427
Year: 1999
Authors: M.Watamori, O.Kubo, K.Oura
Title: A new method for the detection of native oxide on Si with combined use of 16O (α, α) 16O resonance and channeling
Journal: Appl. Surf. Sci., No. 113/114, pp. 403-407
Year: 1997
Authors: M.Watamori, S.Honda, O.Kubo, I.Kanno, T.Hirao, K.Sasabe, K.Oura
Title: High-energy ion beam analysis of ferroelectric thin films
Journal: Appl. Surf. Sci., No. 117/118, pp. 453-458
Year: 1997
Authors: M.Watamori, K.Oura, T.Hirao, K.Sasabe
Title: Backscattering analysis of thin SiO2 films on Si using 16O (α, α) 16O 3.045MeV resonance
Journal: Nucl. Instr. & Methods, No. B118, pp. 228-232
Year: 1996
Authors: M.Watamori, T.Hirao, K.Sasabe
Title: Channeling analysis of oxygen in oxide materials using 16O (α, α) 16O resonant backscattering
Journal: Nucl. Instr. & Methods, No. B118, pp. 233-237
Year: 1996
Authors: M.Watamori
Title: Methodology for Accurate Oxygen Distribution Analysis and Its Application to YBa_2Cu_3O_x Thin Films Using ＾＜16＞O (a, a) ＾＜16＞O 3.045 MeV Resonance Reaction
Journal:
Year: 1900

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